The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Mar. 26, 2009
Norden E. Huang, Jhongli, TW;
Zhao-hua Wu, Jhongli, TW;
Xian-yao Chen, Jhongli, TW;
National Central University, Jhongli, Taoyuan County, TW;
Abstract
For multi-dimensional temporal-spatial data, EEMD is applied to time series of each spatial location to obtain IMF-like components of different time scales. All the ith IMF-like components of all the time series of all spatial locations are arranged to obtain ith temporal-spatial multi-dimensional IMF-like component. For two-dimensional spatial data or images, the two-dimensional spatial data or images are consider as a collection of one-dimensional series in first direction along locations in second direction. The same approach to the one used in temporal-spatial data decomposition is used to obtain the resulting two-dimensional IMF-like components. Each of the resulted IMF-like components are taken as the new two-dimensional data for further decomposition, but the data is considered as a collection of one-dimensional series in second-direction along locations in first-direction.