The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2014

Filed:

Jun. 14, 2012
Applicants:

Masahiro Sakuratani, Nagaokakyo, JP;

Shigekatsu Yamamoto, Nagaokakyo, JP;

Inventors:

Masahiro Sakuratani, Nagaokakyo, JP;

Shigekatsu Yamamoto, Nagaokakyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01G 4/005 (2006.01); H01G 4/06 (2006.01); H01L 41/047 (2006.01); H01L 41/273 (2013.01); H01L 41/29 (2013.01);
U.S. Cl.
CPC ...
H01L 41/0471 (2013.01); H01L 41/29 (2013.01); H01L 41/273 (2013.01);
Abstract

Two or more outer-layer dummy conductors are successively arranged at predetermined intervals in the height direction, thereby forming a plurality of outer-layer dummy groups. Given that an interval between the adjacent outer-layer dummy conductors within each of the outer-layer dummy groups is d and an interval between the adjacent outer-layer dummy groups is g, g is greater than d. On that condition, the outer-layer dummy groups can be positioned satisfactorily apart away from each other, while plating deposition points are ensured. As a result, pressing of inner electrodes through the outer-layer dummy conductors can be relieved, whereby the distance between the inner electrodes can be prevented from being locally shortened and a reduction of BDV can be prevented.


Find Patent Forward Citations

Loading…