The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2014

Filed:

Aug. 30, 2013
Applicant:

Brother Kogyo Kabushiki Kaisha, Nagoya, JP;

Inventors:

Hitoshi Fujino, Tajimi, JP;

Hiroyuki Ominato, Nagoya, JP;

Yoshifumi Nakamura, Inazawa, JP;

Assignee:

Brother Kogyo Kabushiki Kaisha, Nagoya-Shi, Aichi-Ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a scanning optical apparatus including a single lens configured to convert a beam deflected by a polygon mirror into a spot-like image on a to-be-scanned surface, the lens satisfies the conditions: −0.59<β1≦0, −0.46<β2≦0.2, −0.6≦D1<0.43, and −0.17≦D2≦0.16 where β1 indicates an angle [deg] formed in a main scanning plane between a first optical axis and a reference line perpendicular to the to-be-scanned surface, β2 indicates an angle [deg] formed in the main scanning plane between the first optical axis and a second optical axis, D1 indicates an amount of shift [mm] in the main scanning plane, of a point of intersection between the first optical axis and an incident-side lens surface, from the reference line, and D2 indicates an amount of shift [mm] in the main scanning plane, of a point of intersection between the second optical axis and an exit-side lens surface, from the first optical axis.


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