The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Jul. 05, 2012
Takuya Yasuda, Kyoto, JP;
Takuya Yasuda, Kyoto, JP;
Dainippon Screen MFG. Co., Ltd., Kyoto, JP;
Abstract
In an image inspection apparatus, a first accumulation part acquires a reference accumulated value distribution by accumulating values of pixels in a reference image arranged in an image recording direction. A second accumulation part acquires an inspection accumulated value distribution by accumulating values of pixels in the inspection image arranged in the image recording direction. A sensitivity correction part performs sensitivity correction wherein a plurality of accumulated values other than a local peak in the inspection accumulated value distribution are corrected so as to relatively approach a plurality of corresponding accumulated values in the reference accumulated value distribution, based on a ratio between the inspection accumulated value distribution from which the local peak has been removed and the reference accumulated value distribution. A comparison part subtracts the reference accumulated value distribution from the inspection accumulated value distribution that has undergone the sensitivity correction to detect a defect.