The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Oct. 19, 2011
Paul Byron Hays, Ann Arbor, MI (US);
David Keith Johnson, Canton, MI (US);
David Michael Zuk, Dexter, MI (US);
Scott Kevin Lindemann, Howell, MI (US);
Paul Byron Hays, Ann Arbor, MI (US);
David Keith Johnson, Canton, MI (US);
David Michael Zuk, Dexter, MI (US);
Scott Kevin Lindemann, Howell, MI (US);
Michigan Aerospace Corporation, Ann Arbor, MI (US);
Abstract
A fringe pattern from an interferometer is imaged onto a digital micromirror device containing an array of micromirrors in an associated pattern of pixel mirror rotational states that provide for sampling the circular fringe pattern in cooperation with one or more associated photodetectors, so as to provide for generate a corresponding set of associated complementary signals. A plurality of different sets of associated complementary signals generated for a corresponding plurality of mutually independent associated patterns of pixel mirror rotational states are used to determine at least one metric associated with the circular fringe pattern.