The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Feb. 24, 2010
Michael Galle, Grimsby, CA;
Michael Galle, Grimsby, CA;
Other;
Abstract
An interferometer generates interference between two (or more) waves that have traveled separate paths so as to measure a quantity of difference between these paths. One of these paths, the reference path, is usually one with well known spatial and material properties (such as free 5 space). The other path(s) is(are) the test path(s). The main difficulties in interferometry stem from the production and operation of this physical reference path. The present invention solves this problem by replacing the physical reference path with a virtual one. This is done by suitable operation on the physically generated interference pattern of an unreferenced interferometer with a virtually generated sinusoid of frequency corresponding to the desired reference path length. The result is a new form of interferometer called a Virtual Reference Interferometer.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile