The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Nov. 12, 2010
James B. Colvin, Newark, CA (US);
James B. Colvin, Newark, CA (US);
Other;
Abstract
A thermal gradient is induced in a device-under-test (DUT) and used to determine the location of a defect. In one embodiment, a laser creates a moving thermal gradient from a test site on the DUT and a respective time of flight for the thermal gradient to trigger a condition associated with the defect is determined. Repeating the time of flight testing at additional test site provides information used to trilaterate the defect in three dimensions. Alternately, a static thermal gradient is induced across at least a portion of the DUT along a first axis. The thermal gradient is incrementally walked along the first axis until the condition associated with the defect is triggered, thereby defining a first region. The thermal gradient is then induced along a second axis of the DUT and the process is repeated to define a second region. The location of the defect is determined to be the intersection of the first region with the second region.