The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2014

Filed:

Nov. 04, 2009
Applicant:

Takashi Izumi, Tokyo, JP;

Inventor:

Takashi Izumi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 27/146 (2006.01); H01L 21/768 (2006.01); H01L 21/74 (2006.01); H01L 23/31 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76898 (2013.01); H01L 2224/02372 (2013.01); H01L 2224/05548 (2013.01); H01L 23/3114 (2013.01); H01L 27/14632 (2013.01); H01L 2224/13021 (2013.01); H01L 2224/16146 (2013.01); H01L 2924/0002 (2013.01); H01L 21/743 (2013.01); H01L 2224/13024 (2013.01); H01L 23/481 (2013.01); H01L 2224/13 (2013.01); H01L 27/14618 (2013.01); H01L 2224/05 (2013.01);
Abstract

A semiconductor device manufacturing method is disclosed. The method includes etching a silicon on insulator (SOI) from its surface (i.e., semiconductor substrate layer) to form a first trench and a second trench. The first trench extends through the SOI substrate and reaches an electrode pad. The second trench terminates in the semiconductor substrate layer. The manufacturing method also includes forming an insulation film that covers the surface of the semiconductor substrate layer as well as the side walls and bottoms of the first and second trenches. The manufacturing method also includes removing the insulation film from the bottoms of the first and second trenches to expose the electrode pad from the first trench bottom and to expose the semiconductor substrate layer from the second trench bottom.


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