The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Sep. 20, 2010
Brian Schulkin, Troy, NY (US);
Xi-cheng Zhang, Troy, NY (US);
Thomas Tongue, Niskayuna, NY (US);
Jingzhou Xu, Ann Arbor, MI (US);
Jian Chen, Troy, MI (US);
Brian Schulkin, Troy, NY (US);
Xi-Cheng Zhang, Troy, NY (US);
Thomas Tongue, Niskayuna, NY (US);
Jingzhou Xu, Ann Arbor, MI (US);
Jian Chen, Troy, MI (US);
Rensselaer Polytechnic Institute, Troy, NY (US);
Abstract
Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.