The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Nov. 30, 2010
Taichi Ijuin, Sagamihara, JP;
Tomio Yamauchi, Sagamihara, JP;
Akira Kawazoe, Sagamihara, JP;
Tetsuya Takatomi, Sagamihara, JP;
Taichi Ijuin, Sagamihara, JP;
Tomio Yamauchi, Sagamihara, JP;
Akira Kawazoe, Sagamihara, JP;
Tetsuya Takatomi, Sagamihara, JP;
Daiwa Can Company, Tokyo, JP;
Abstract
A method for inspecting sealing defects of a container using infrared light. Infrared light in a wavelength range of 1450 nm±20 nm is irradiated from a phototransmitter onto the sealed portion of a sample container Infrared light reflected from or transmitted through the sealed portion of the sample container is received by a photoreceiver, and transmitted to a photodetector through an optical fiber. The infrared light in a same wavelength range as the case of inspecting the sample container is irradiated onto the sealed portion of a container to be inspected. The infrared light reflected from or transmitted through the sealed portion of the inspected container is converted into the analog voltage value and transmitted to a controller. If the infrared light is reduced to be smaller than a threshold set on the basis of the sample container, the sealed portion of the inspected container is judged as a sealing defect.