The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2014

Filed:

Mar. 11, 2009
Applicants:

Tokunobu Akao, Toyama, JP;

Kazuyoshi Yamamoto, Toyama, JP;

Inventors:

Tokunobu Akao, Toyama, JP;

Kazuyoshi Yamamoto, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/00 (2006.01); C23F 1/00 (2006.01); H01L 21/306 (2006.01); G06F 19/00 (2011.01); G05B 19/418 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4183 (2013.01); G05B 2219/31291 (2013.01); H01L 21/67276 (2013.01); G05B 2219/31304 (2013.01);
Abstract

There is provided a substrate processing apparatus that can easily grasp the relationship of a defect substrate between plural batches. A substrate processing apparatusincludes: a display unit; a storage unit that accumulates and stores production information of the substrate for each batch, the production information being produced when the substrate is processed; a selection receiving unit that receives the selection of plural batches stored in the storage unit; and a display control unit that controls such that substrate information is displayed on the display part, the substrate information being information relating to a state in which the substrates are held the substrate holding part in the plural batches received by the selection receiving unit.


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