The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2014

Filed:

Mar. 25, 2010
Applicants:

Evelyne Gridelet, Seraing, BE;

Pablo Garcia Tello, Leuven, BE;

Michiel Jos Van Duuren, Valkenswaard, NL;

Nader Akil, Sterrebeek, BE;

Inventors:

Evelyne Gridelet, Seraing, BE;

Pablo Garcia Tello, Leuven, BE;

Michiel Jos Van Duuren, Valkenswaard, NL;

Nader Akil, Sterrebeek, BE;

Assignee:

NXP, B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/036 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sensor device for analyzing fluidic samples is provided. The sensor device includes a stacked sensing arrangement having at least three sensing layers and a multilayer structure. The multilayer structure has a hole formed therein which is adapted to let pass the fluidic sample and the stacked sensing arrangement is formed in the multilayer structure in such a way that the fluidic sample passes the stacked sensing arrangement when the fluidic sample passes the hole.


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