The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Dec. 19, 2012
Teledyne Lecroy, Inc., Thousand Oaks, CA (US);
Linden Hsu, Cupertino, CA (US);
Thomas R. Kennedy, III, Alviso, CA (US);
Samuel Sukhi Bae, San Jose, CA (US);
Christopher F. Forker, Redwood City, CA (US);
Shlomi Krepner, Sunnyvale, CA (US);
Yigal Shaul, Cupertino, CA (US);
Teledyne LeCroy, Inc., Thousands Oaks, CA (US);
Abstract
A method and an apparatus for performing link equalization testing via a physical layer test and measurement system. The system includes a protocol aware test apparatus for transmitting testing data, a device under test for receiving the transmitted testing data, and an oscilloscope for receiving an output waveform from the device under test. The protocol aware test apparatus selects a first of a plurality of preset values, sends an equalization signal from the protocol aware test apparatus to the device under test, and changes a speed of communication to a predetermined speed and sends a compliance pattern to the device under test after placing the device under test in a loopback mode. A waveform output from the device under test is captured by the oscilloscope, and is analyzed to determine compliance of the device under test with a predetermined link equalization speed in accordance with a predetermined protocol.