The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Nov. 24, 2008
Zhaohui Sun, Niskayuna, NY (US);
Catherine Mary Graichen, Malta, NY (US);
Corey Nicholas Bufi, Troy, NY (US);
Anthony James Hoogs, Niskayuna, NY (US);
Aaron Shaw Markham, Pasadena, CA (US);
Budhaditya Deb, Niskayuna, NY (US);
Roderic Greene Collins, Troy, NY (US);
Michael Shane Wilkinson, Newhall, CA (US);
Anthony Christopher Anderson, Castaic, CA (US);
Jenny Marie Weisenberg, Niskayuna, NY (US);
Zhaohui Sun, Niskayuna, NY (US);
Catherine Mary Graichen, Malta, NY (US);
Corey Nicholas Bufi, Troy, NY (US);
Anthony James Hoogs, Niskayuna, NY (US);
Aaron Shaw Markham, Pasadena, CA (US);
Budhaditya Deb, Niskayuna, NY (US);
Roderic Greene Collins, Troy, NY (US);
Michael Shane Wilkinson, Newhall, CA (US);
Anthony Christopher Anderson, Castaic, CA (US);
Jenny Marie Weisenberg, Niskayuna, NY (US);
NBCUniversal Media, LLC, Wilmington, DE (US);
Abstract
A method and system for identifying a source of a copied work that in one embodiment includes obtaining at least some portions of a reference work, collecting at least some portions of the suspect work, matching the suspect work with the reference work, wherein the matching includes temporally aligning one or more frames of the reference work and the suspect work, spatially aligning frames of the reference work and the suspect work, and detecting forensic marks in the suspect work by spatiotemporal matching with the reference work.