The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Sep. 23, 2011
Robert J. Baseman, Brewster, NY (US);
Amit Dhurandhar, Yorktown Heights, NY (US);
Sholom M. Weiss, Yorktown Heights, NY (US);
Brian F. White, Yorktown Heights, NY (US);
Robert J. Baseman, Brewster, NY (US);
Amit Dhurandhar, Yorktown Heights, NY (US);
Sholom M. Weiss, Yorktown Heights, NY (US);
Brian F. White, Yorktown Heights, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system, method and computer program product for predicting at least one feature of at least one product being manufactured. The system receives, from at least one sensor installed in equipment performing one or more manufacturing process steps, at least one measurement of the feature of the product being manufactured. The system selects one or more of the received measurement of the feature of the product. The system estimates additional measurements of the feature of the product at a current manufacturing process step. The system creates a computational model for predicting future measurements of the feature of the product, based on the selected measurement and the estimated additional measurements. The system predicts the future measurements of the feature of the product based on the created computational model. The system outputs the predicted future measurements of the feature of the product.