The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Apr. 27, 2011
Tools for design and analysis of over-the-air test systems with channel model emulation capabilities
Matt A. Mow, Los Altos, CA (US);
BO Niu, Sunnyvale, CA (US);
Robert W. Schlub, Cupertino, CA (US);
Ruben Caballero, San Jose, CA (US);
Matt A. Mow, Los Altos, CA (US);
Bo Niu, Sunnyvale, CA (US);
Robert W. Schlub, Cupertino, CA (US);
Ruben Caballero, San Jose, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A wireless electronic device may serve as a device under test in a test system. The test system may include an array of over-the-air antennas that can be used in performing over-the-air wireless tests on the device under test (DUT). A channel model may be used in modeling a multiple-input-multiple-output (MIMO) channel between a multi-antenna wireless base station and a multi-antenna DUT. The test system may be configured to perform over-the-air tests that emulate the channel model. A design and analysis tool may be used to identify an optimum over-the-air test system setup. The tool may be used in converting a geometric model to a stochastic model for performing conducted tests. The tool may be used in converting a stochastic model to a geometric model and then further convert the geometric model to an over-the-air emulated stochastic model. The over-the-air emulated stochastic model may be used in performing conducted tests.