The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2014

Filed:

Apr. 10, 2008
Applicants:

Ting Ku, San Jose, CA (US);

Shifeng Yu, Fremont, CA (US);

Brian Smith, Mountain View, CA (US);

Inventors:

Ting Ku, San Jose, CA (US);

Shifeng Yu, Fremont, CA (US);

Brian Smith, Mountain View, CA (US);

Assignee:

Nvidia Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01);
U.S. Cl.
CPC ...
G01K 15/00 (2013.01);
Abstract

A system and method for calibrating an integrated circuit. The method includes configuring a first impedance for a first output of the integrated circuit according to a first configuration code and measuring a first voltage at the first output which corresponds to the first configuration code. The method further includes configuring a second impedance for a second output of the integrated circuit according to a second configuration code and measuring a second voltage at the second output which corresponds to the second configuration code. A determination of which of the first voltage and the second voltage is nearest to a predetermined voltage value. Based on the voltage determination, the integrated circuit is configured according a code of said first and second codes that corresponds to the voltage nearest to the predetermined voltage.


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