The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Aug. 19, 2011
Bjørn A. J. Angelsen, Trondheim, NO;
Rune Hansen, Trondheim, NO;
Thor Andreas Tangen, Trondheim, NO;
Bjørn A. J. Angelsen, Trondheim, NO;
Rune Hansen, Trondheim, NO;
Thor Andreas Tangen, Trondheim, NO;
Surf Technology AS, Trondheim, NO;
Abstract
1and 2pulsed waves are transmitted along 1and 2transmit beams where at least one of the beams is broad in at least one direction, and the transmit timing between said 1and 2pulsed waves are selected so that the pulsed wave fronts overlap in an overlap region R(r,t) that propagates along at least one measurement or image curve Γ(r) in the material object. At least the scattered signal produced by nonlinear interaction between said 1and 2waves in the overlap region is received and processed to form a nonlinear interaction scattering image signal along Γ(r). The measurement or image curve Γ(r) can be scanned laterally by either changing of the relative transmit timing between the 1and 2pulsed waves or the direction of at least one of the 1and 2transmit beams, or both. The methods are applicable to image nonlinear scattering sources for both electromagnetic and elastic waves, and combinations of these.