The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2014

Filed:

Sep. 27, 2010
Applicants:

Feng Tang, Mountain View, CA (US);

Yuli Gao, Mountain View, CA (US);

Suk Hwan Lim, Mountain View, CA (US);

Inventors:

Feng Tang, Mountain View, CA (US);

Yuli Gao, Mountain View, CA (US);

Suk Hwan Lim, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and a method for near-duplicate image detection performed by a physical computing system includes applying a feature determining function to a number of images, a feature being defined by a geometric shape, comparing characteristics of said geometric shapes defining said features from at least two of said number of images, and characterizing said at least two of said number of images as a near-duplicate match if a predetermined percentage of said features of said at least two images match.


Find Patent Forward Citations

Tang, Feng. (2014). Near-duplicate image detection (U.S. Patent No. 8792728). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8792728

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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