The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2014

Filed:

Aug. 15, 2008
Applicants:

Nicholas John Weston, Peebles, GB;

Yvonne Ruth Huddart, Edinburgh, GB;

Andrew John Moore, Edinburgh, GB;

Timothy Charles Featherstone, Edinburgh, GB;

Inventors:

Nicholas John Weston, Peebles, GB;

Yvonne Ruth Huddart, Edinburgh, GB;

Andrew John Moore, Edinburgh, GB;

Timothy Charles Featherstone, Edinburgh, GB;

Assignee:

Renishaw PLC, Wotton-Under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01B 11/00 (2006.01); G01B 11/02 (2006.01); G06T 7/00 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/007 (2013.01); G01B 11/026 (2013.01); G06T 7/0057 (2013.01); G01B 11/2527 (2013.01);
Abstract

A non-contact method and apparatus for inspecting an object via phase analysis. A projector projects an optical pattern onto the surface of an object to be inspected. At least first and second images of the surface on which the optical pattern is projected are then obtained. The phase of the optical pattern at the surface is changed between the first and second image by moving the projector relative to the object.


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