The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2014

Filed:

Mar. 11, 2011
Applicants:

Jon Downton, Calgary, CA;

Benjamin Roure, Calgary, CA;

Inventors:

Jon Downton, Calgary, CA;

Benjamin Roure, Calgary, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01); G01V 1/24 (2006.01);
U.S. Cl.
CPC ...
G01V 1/24 (2013.01); G01V 1/282 (2013.01); G01V 2210/626 (2013.01);
Abstract

An improved method for analyzing seismic data to obtain elastic attributes is disclosed. In one embodiment, a reflectivity series is determined for at least one seismic trace of seismic data obtained for a subterranean formation, where the reflectivity series includes anisotropy properties of a formation. One or more synthetic seismic traces are obtained by convolving the reflectivity series with a source wavelet. The one or more synthetic seismic traces are inverted to obtain elastic parameters estimates. According to one aspect, the data inputs are angle-azimuth stacks. According to another aspect, the data inputs are azimuthal Fourier coefficients, u, v.


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