The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Mar. 25, 2009
William B. King, Rancho Palos Verdes, CA (US);
Chungte W. Chen, Irvine, CA (US);
Robert W. Byren, Manhattan Beach, CA (US);
Lacy G. Cook, El Segundo, CA (US);
William B. King, Rancho Palos Verdes, CA (US);
Chungte W. Chen, Irvine, CA (US);
Robert W. Byren, Manhattan Beach, CA (US);
Lacy G. Cook, El Segundo, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
In one or more embodiments, a beam control apparatus and method for correcting aberrations include an off-aperture telescope configured to receive a beam of electromagnetic energy, wherein the telescope includes a first optical element and a second optical element. The second optical element is configured to be translated in three orthogonal axes, and a wavefront error sensor is configured to detect aberrations in the beam and to provide a wavefront error signal in response thereto. A processor is configured to provide a correction signal in response to the wavefront error signal, and an actuator is coupled to the second optical element and configured, in response to the wavefront error signal, to selectively translate the second optical element in one or more of three substantially orthogonal directions corresponding to the three orthogonal axes.