The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2014

Filed:

Feb. 15, 2013
Applicant:

Takuya Shimahashi, Nagoya, JP;

Inventor:

Takuya Shimahashi, Nagoya, JP;

Assignee:

Brother Kogyo Kabushiki Kaisha, Nagoya, Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); G03G 15/043 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a control apparatus, first type binary image data representing density of pixels arranged along a first image direction at a first resolution is acquired, and a first determining process is executed to determine an exposure pattern used to execute exposures of exposure lines at a second resolution lower than the first resolution along a first exposure direction. In the first determining process, a partial exposure pattern for exposing an output partial area that is correlated with a binary partial area and that overlaps N successive exposure lines is determined such that distribution of exposure amounts in the output partial area along the first exposure direction differs according to layout of second-value pixels in the binary partial area at least in the first image direction, thereby enabling an image of color material to be formed through development at a resolution higher than the second resolution in the first exposure direction.


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