The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2014

Filed:

Dec. 29, 2009
Applicants:

Joël Chevrier, Saint Egreve, FR;

Serge Huant, Grenoble Cedex, FR;

Wilfrid Schwartz, Grenoble Cedex, FR;

Alessandro Siria, Grenoble Cedex, FR;

Inventors:

Joël Chevrier, Saint Egreve, FR;

Serge Huant, Grenoble Cedex, FR;

Wilfrid Schwartz, Grenoble Cedex, FR;

Alessandro Siria, Grenoble Cedex, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The instant disclosure describes an optical device for the interferometric analysis of the surface condition of an object, including: a light source; an optical fiber capable of receiving the incident light wave and transmitting said wave to the object; a detector capable of detecting a combination between a light wave reflected by the optical fiber and a light wave returned by the object; and in which the optical fiber has a free end in the shape of a cone, with a vertex angle of between 15 and 25 degrees, the tip of the cone having dimensions of less than 50×50 nm, and the tip of the cone being placed, while in use, at a distance of between 5 and 50 μm from the surface of the object.


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