The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Oct. 26, 2010
Toshiyuki Imai, Hachioji, JP;
Tougo Teramoto, Wakayama, JP;
Yasushi Iijima, Hachioji, JP;
Shigeru Hosoe, Hino, JP;
Akira Sato, Hachioji, JP;
Yuiti Fujii, Hachioji, JP;
Daisuke Watanabe, Niiza, JP;
Toshiyuki Imai, Hachioji, JP;
Tougo Teramoto, Wakayama, JP;
Yasushi Iijima, Hachioji, JP;
Shigeru Hosoe, Hino, JP;
Akira Sato, Hachioji, JP;
Yuiti Fujii, Hachioji, JP;
Daisuke Watanabe, Niiza, JP;
Konica Minolta Advanced Layers Inc., Tokyo, JP;
Abstract
Disclosed is an image pickup device, by which cut resistance at the time of cutting a wafer lens is reduced, high production efficiency is maintained, and excellent optical characteristics are obtained. The image pickup device has a first lens block, a second lens block, a spacer, and a sensor unit. The side surface section of the first lens block, the side surface section of the second lens block, and the side surface section of the spacer are formed on the same plane. A lens cover that covers the first and the second lens blocks is provided in a step formed by respective side surface sections of the first lens block, the second lens block and the spacer, and the side surface section of the sensor unit.