The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Oct. 30, 2008
Applicants:
David G. Grier, New York, NY (US);
Sang-hyuk Lee, Albany, CA (US);
Fook C. Cheong, New York, NY (US);
Inventors:
David G. Grier, New York, NY (US);
Sang-Hyuk Lee, Albany, CA (US);
Fook C. Cheong, New York, NY (US);
Assignee:
New York University, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/89 (2006.01); G03H 1/00 (2006.01); G01P 5/20 (2006.01); G01P 5/00 (2006.01); G01N 15/14 (2006.01); G01N 15/02 (2006.01); G03H 1/04 (2006.01); G03H 1/08 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0227 (2013.01); G01N 2015/025 (2013.01); G03H 1/0005 (2013.01); G01P 5/20 (2013.01); G03H 2001/005 (2013.01); G03H 2240/56 (2013.01); G03H 2001/0033 (2013.01); G03H 2001/0447 (2013.01); G03H 2001/0825 (2013.01); G01P 5/001 (2013.01); G03H 1/0866 (2013.01); G01N 15/1463 (2013.01); G01N 2015/0038 (2013.01);
Abstract
In-line holography to create images of a specimen, such as one or more particles dispersed in a transparent medium. Analyzing these images with results from light scattering theory yields the particles' sizes with nanometer resolution, their refractive indexes to within one part in a thousand, and their three dimensional positions with nanometer resolution. This procedure can rapidly and directly characterize mechanical, optical and chemical properties of the specimen and its medium.