The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2014

Filed:

Jan. 08, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Shuichi Kurokawa, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 15/14 (2006.01); B41J 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanning apparatus, including: a light source including a plurality of light emitting parts; a deflector including a deflecting surface; a first optical system configured to cause the plurality of light beams to enter the deflecting surface at an oblique angle; and a second optical system configured to focus the light beams on a surface to be scanned, in which: the light emitting parts are arranged away from each other; the second optical system includes an optical element including at least one optical surface having a non-arc shape, so that a wave optics interval between scanning lines based on barycentric positions of spot images on the surface to be scanned is aligned along the main scanning direction; the non-arc shape of the at least one optical surface of the optical element within the sub-scanning section is defined by a predetermined condition.


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