The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2014

Filed:

Jun. 03, 2011
Applicants:

Takuro Noda, Tokyo, JP;

Akihiro Komori, Tokyo, JP;

Nariaki Satoh, Kanagawa, JP;

Osamu Shigeta, Tokyo, JP;

Kazuyuki Yamamoto, Kanagawa, JP;

Inventors:

Takuro Noda, Tokyo, JP;

Akihiro Komori, Tokyo, JP;

Nariaki Satoh, Kanagawa, JP;

Osamu Shigeta, Tokyo, JP;

Kazuyuki Yamamoto, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/048 (2013.01); G06T 15/00 (2011.01); G09G 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided an information processing device including a display section configured to display a first object in a virtual three-dimensional space having a depth direction of a display screen, an operation section configured to acquire an operation for moving the first object in at least the depth direction, and a controller configured to move the first object on the display screen in accordance with the acquired operation, to execute, when a region of the first object overlaps a first overlap determination region, a first process to one or both of the first and second objects, and to execute, when the region of the first object overlaps a second overlap determination region, a second process to one or both of the first and second objects. The first overlap determination region may be a region obtained by extending the second overlap determination region in at least the depth direction.


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