The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Nov. 30, 2009
Joo-haeng Lee, Daejeon, KR;
Sung-soo Kim, Daejeon, KR;
Seung Woo Nam, Daejeon, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Abstract
An image synthesis apparatus supporting measured materials properties includes an input unit for receiving from a user selected information on material information processing, sampling and rendering; a material information processing unit for converting measured material data into raw material data, performing material model fitting on the raw material data to generate material information and performing material mixing on the material information to generate mixed material information, wherein the model fitting and the material mixing is performed according to the selected information; and a sampling unit for sampling the raw material data to generate sampling information. The apparatus further includes a materials properties rendering unit for rendering scene information contained in the selected information, the mixed material information and the sampling information to generate surface material information; and an output unit for visualizing the material information and the surface material information.