The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Aug. 03, 2007
Young Min Kim, Wallingford, CT (US);
Yanning Zhu, Snoqualmie, WA (US);
Yash Agarwal, New Haven, CT (US);
Xiuzhong Wang, Hamden, CT (US);
Aaron Armstrong, Stamford, CT (US);
Robert Borgerding, New Haven, CT (US);
Andrew Macginitie, Roxbury, CT (US);
Antti Seppo, New York, NY (US);
Ilia Ichetovkin, Hamden, CT (US);
Michael Kilpatrick, West Hartford, CT (US);
Petros Tsipouras, Madison, CT (US);
Triantafyllos P. Tafas, Rocky Hill, CT (US);
Young Min Kim, Wallingford, CT (US);
Yanning Zhu, Snoqualmie, WA (US);
Yash Agarwal, New Haven, CT (US);
Xiuzhong Wang, Hamden, CT (US);
Aaron Armstrong, Stamford, CT (US);
Robert Borgerding, New Haven, CT (US);
Andrew Macginitie, Roxbury, CT (US);
Antti Seppo, New York, NY (US);
Ilia Ichetovkin, Hamden, CT (US);
Michael Kilpatrick, West Hartford, CT (US);
Petros Tsipouras, Madison, CT (US);
Triantafyllos P. Tafas, Rocky Hill, CT (US);
Ikonisys, Inc., New Haven, CT (US);
Abstract
A method for automated microscopic analysis wherein the test protocol is obtained from interrogatable data affixed to each microscope slide. The method further comprises the algorithms that implement the test protocol.