The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Apr. 07, 2011
Hans-arno Synal, Steinmaur, CH;
Tim Schulze-könig, Heidelberg, DE;
Martin Suter, Uster, CH;
Eth Zürich, Eth Transfer, Zürich, CH;
Abstract
A mass spectrometry system based on the general principle of accelerator mass spectrometry (AMS) is disclosed. An ion source () generates a beam (B) of ions having a negative charge state. A first mass analyzer () transmits only ions having a predetermined mass. The ions are passed through a stripper target () comprising helium and/or hydrogen as a stripping gas to change the charge state of said ions from negative to positive charge and to dissociate molecular ions by collisions. A second mass analyzer () transmits ions in charge state 1+ having the predetermined mass, which are detected by a detector (). By using helium and/or hydrogen gas and detecting ions in charge state 1+, it becomes possible to use kinetic energies below 200 keV without excessive transmission losses due to angular straggling. At sufficiently low energies, no additional acceleration is required after ions have been extracted from the ion source. In alternative embodiments, no mass selection is carried out before charge exchange takes place.