The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Nov. 19, 2012
Mettler-toledo Ag, Greifensee, CH;
Peter Alfred Blacklin, Columbia, MD (US);
Wayne Fowler, Jr., Annapolis, MD (US);
Joel Michael Hawkins, Old Lyme, CT (US);
Howard William Ward, II, Lyme, CT (US);
Mettler-Toledo AG, Greifensee, CH;
Abstract
An sampling device for capturing a material sample and a method of using said device to process said material sample in situ within the device. Embodiments of the invention may be disposed as elongate probes having extendable sample capture elements. A sample capture element of such a device may include a sample capture pocket located near a distal end thereof for capturing and trapping a sample of material. The sample capture pocket may be provided with a port for receiving material therein and a port for expelling material therefrom. These ports may be placed in communication with corresponding material transfer channels extending through the sample capture element to allow for the in situ processing of a material sample, and the subsequent discharge of the sample to an analyzer or another downstream location.