The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2014
Filed:
Feb. 16, 2012
Charles G. Schroeder, Cedar Park, TX (US);
Christopher F. Graf, Liberty Hill, TX (US);
Ciro T. Nishiguchi, Austin, TX (US);
Nigel G. D'souza, Austin, TX (US);
Daniel J. Baker, West Lafayette, IN (US);
Thomas D. Magruder, Austin, TX (US);
Charles G. Schroeder, Cedar Park, TX (US);
Christopher F. Graf, Liberty Hill, TX (US);
Ciro T. Nishiguchi, Austin, TX (US);
Nigel G. D'Souza, Austin, TX (US);
Daniel J. Baker, West Lafayette, IN (US);
Thomas D. Magruder, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
Customizing a test instrument. A plurality of pairs of code modules may be provided. Each pair of code modules may include a first code module having program instructions for execution by a processor of the test instrument and a second code module for implementation on a programmable hardware element of the test instrument. For each pair of code modules, the first code module and the second code module may collectively implement a function in the test instrument. User input may be received specifying modification of a second code module of at least one of the plurality of pairs of code modules. Accordingly, a hardware description may be generated for the programmable hardware element of the test instrument based on the modified second code module.