The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2014

Filed:

Jul. 27, 2009
Applicants:

Avinash Ramanath, Westlake Village, CA (US);

Yossi Maish, West Hills, CA (US);

Inventors:

Avinash Ramanath, Westlake Village, CA (US);

Yossi Maish, West Hills, CA (US);

Assignee:

Ixia, Calabasas, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 15/16 (2006.01); H04L 12/26 (2006.01); G06F 3/0481 (2013.01);
U.S. Cl.
CPC ...
H04L 43/50 (2013.01); G06F 3/0481 (2013.01); G06F 2203/04803 (2013.01); H04L 12/2697 (2013.01);
Abstract

Combining lower layer network tests and upper layer network tests is disclosed. A method includes receiving a user selection to create an upper layer test and a lower layer test, receiving upper layer test information and lower layer test information, displaying a first timeline showing the activity of the upper layer test in a first pane and a second timeline showing the activity of the lower layer test in a second pane. Synchronization between the lower layer tests and upper layer tests may be defined. The method allows for observing and ascertaining the impact of the lower layer tests on the upper layer tests. The method may be implemented in software, stored on a storage medium and performed on a network testing system that includes one or more network cards and in one or more network testing systems.


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