The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2014
Filed:
Jul. 28, 2010
Kyeong Dal Choi, Seoul, KR;
Ji Kwang Lee, Wanju-gun, KR;
Woo Seok Kim, Seoul, KR;
Chan Park, Seoul, KR;
Byung Wook Han, Anyang-si, KR;
SE Yeon Lee, Suwon-si, KR;
Kyeong Dal Choi, Seoul, KR;
Ji Kwang Lee, Wanju-gun, KR;
Woo Seok Kim, Seoul, KR;
Chan Park, Seoul, KR;
Byung Wook Han, Anyang-si, KR;
Se Yeon Lee, Suwon-si, KR;
Korea Polytechnic University Industry Academic Cooperation Foundation, Siheung-si, KR;
Woosuk University Industry Academic Cooperation Foundation, Wanju-gun, KR;
Abstract
A method for measuring critical current density of superconductor wires according to the present invention is characterized in that it includes: (a) applying an external magnetic field to the superconductor wires, (b) measuring a magnetization loss of the superconductor wires according to the application of the external magnetic field, (c) normalizing the measured magnetization loss, and then calculating a fully-penetration magnetic field of the superconductor wires according to the normalized magnetization loss, (d) calculating a critical current density of the superconductor wires according to the calculated fully-penetration magnetic field. Therefore, the critical current density of parallel superconductor wires such as stacked superconductor wires may be measured without applying current to the superconductor wires directly.