The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2014
Filed:
Jan. 11, 2008
J. Paul Robinson, West Lafayette, IN (US);
Bartlomiej Rajwa, West Lafayette, IN (US);
Bulent Bayraktar, West Lafayette, IN (US);
Arun K. Bhunia, West Lafayette, IN (US);
E. Daniel Hirleman, West Lafayette, IN (US);
Euiwon Bae, West Lafayette, IN (US);
J. Paul Robinson, West Lafayette, IN (US);
Bartlomiej Rajwa, West Lafayette, IN (US);
Bulent Bayraktar, West Lafayette, IN (US);
Arun K. Bhunia, West Lafayette, IN (US);
E. Daniel Hirleman, West Lafayette, IN (US);
Euiwon Bae, West Lafayette, IN (US);
Purdue Research Foundation, West Lafayette, IN (US);
Abstract
A system and method for identifying organisms by analysis of scattergrams of colonies is disclosed. cattergrams are obtained by culturing samples and illuminating the resultant colonies by a laser. The forward scattered light is imaged and subject to a feature extraction process. The feature vector may include Zernike or Chebyshev moments and may also include Harelick texture features. Feature vectors may be used to train a classification process using either supervised or unsupervised machine learning techniques. The classification process may be used to associate a colony phenotype with the genotype of the sample.