The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2014
Filed:
Jan. 25, 2012
Applicants:
David R. Demmer, Toronto, CA;
Thomas L. Haslett, Toronto, CA;
Jason M. Eichenholz, Orlando, FL (US);
Inventors:
David R. Demmer, Toronto, CA;
Thomas L. Haslett, Toronto, CA;
Jason M. Eichenholz, Orlando, FL (US);
Assignee:
Ocean Optics, Inc., Dunedin, FL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G02B 26/02 (2006.01); G01J 3/02 (2006.01); G01J 3/04 (2006.01);
U.S. Cl.
CPC ...
G01J 3/04 (2013.01); G01J 3/0291 (2013.01); G01J 3/0208 (2013.01); G01J 3/0286 (2013.01); G01J 3/0256 (2013.01); G01J 3/0229 (2013.01); G01J 3/0205 (2013.01);
Abstract
An aperture shaped to provide a narrow beam in the horizontal plane but a wider beam in the vertical plane that will provide improved image quality in spectrometers without sacrificing as much throughput as typically experienced using a reduced diameter round aperture along with a method of mounting the entrance slit and the limiting aperture on a transparent block for optical stability and ease of alignment is disclosed.