The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2014
Filed:
Jun. 02, 2010
Javier Ramón Echauz, Alpharetta, GA (US);
David E. Snyder, Bainbridge Island, WA (US);
Kent W. Leyde, Sammamish, WA (US);
Javier Ramón Echauz, Alpharetta, GA (US);
David E. Snyder, Bainbridge Island, WA (US);
Kent W. Leyde, Sammamish, WA (US);
Cyberonics, Inc., Houston, TX (US);
Abstract
Method and apparatus for improved processing for multi-channel signals. In an exemplary embodiment, an anomaly metric is computed for a multi-channel signal over a time window. The magnitude of the anomaly metric may be used to determine whether an anomaly is present in the multi-channel signal over the time window. In an exemplary embodiment, the anomaly metric may be a condition number associated with the singular values of the multi-channel signal over the time window, as further adjusted by the number of channels to produce a data condition number. Applications of the anomaly metric computation include the scrubbing of signal archives for epileptic seizure detection/prediction/counter-prediction algorithm training, pre-processing of multi-channel signals for real-time monitoring of bio-systems, and boot-up and/or adaptive self-checking of such systems during normal operation.