The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2014
Filed:
Dec. 23, 2008
Substrate for organic light-emitting device, and also organic light-emitting device incorporating it
Guillaume Lecamp, Paris, FR;
François-julien Vermersch, Paris, FR;
Svetoslav Tchakarov, Arcueil, FR;
Hadia Gerardin, Paris, FR;
Alessandro Giassi, Paris, FR;
Guillaume Lecamp, Paris, FR;
François-Julien Vermersch, Paris, FR;
Svetoslav Tchakarov, Arcueil, FR;
Hadia Gerardin, Paris, FR;
Alessandro Giassi, Paris, FR;
Saint-Gobain Glass France, Courbevoie, FR;
Abstract
A substrate for an organic light-emitting device, includes a transparent substrate having an optical index n, bearing, on a first main face, a first transparent or semi-transparent coating of an electrode, referred to as the lower electrode, with a sheet resistance less than or equal to 6Ω/□ and which includes the following stack of layers: an anti-reflection sublayer having a given optical thickness Land having an optical index nsuch that the ratio of nto nis greater than or equal to 6/5; a first metallic layer having a given thickness e; a first separating layer, having a given optical thickness L; a second metallic layer, having an intrinsic electrical conductivity property, and having a given thickness e; and an overlayer for adapting the work function, Lbeing between 20 nm and 120 nm, Lbetween 75 nm and 200 nm, and the sum of the thicknesses e+eof the first and second metallic layers being less than or equal to 40 nm.