The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2014
Filed:
Mar. 09, 2013
Applicants:
Ching Wu, Acton, MA (US);
Clinton Alawn Krueger, Milton, MA (US);
Anthony Joseph Midey, Maynard, MA (US);
Mark A. Osgood, Brookline, NH (US);
Inventors:
Ching Wu, Acton, MA (US);
Clinton Alawn Krueger, Milton, MA (US);
Anthony Joseph Midey, Maynard, MA (US);
Mark A. Osgood, Brookline, NH (US);
Assignee:
Excellims Corporation, Acton, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to a parallel IMS and MS measurement method where a sample flow is split and delivered to an IMS and a MS in parallel. A parallel acquisition MS/IMS method is used to supplement LC-MS and or MS data by using a synchronized MS/IMS acquisition.