The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2014
Filed:
Sep. 11, 2009
Ryan J. Bell, Pinellas Park, FL (US);
R. Timothy Short, St. Petersburg, FL (US);
Strawn K. Toler, Bradenton, FL (US);
Robert H. Byrne, St. Petersburg, FL (US);
Ryan J. Bell, Pinellas Park, FL (US);
R. Timothy Short, St. Petersburg, FL (US);
Strawn K. Toler, Bradenton, FL (US);
Robert H. Byrne, St. Petersburg, FL (US);
SRI International, Menlo Park, CA (US);
Abstract
The present invention relates generally a method and apparatus for measuring multiple parameters in-situ in a sample collected from an environmental system via a single device. In one embodiment, the method includes collecting the sample from said environmental system via the single device, measuring a first parameter of the sample in-situ via the single device, adding a reagent tot the sample within the single device to create a reagent infused sample and measuring a second parameter of the sample in-situ via the single device using the reagent infused sample.