The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2014
Filed:
Sep. 19, 2011
Reto Nardini, Langendorf, CH;
Adrian Baumgartner, Langendorf, CH;
Urs Hulliger, Langendorf, CH;
Depuy Synthes Products, LLC, Raynham, MA (US);
Abstract
A device for measuring a degree of bending of an intramedullary nail comprises a probe sized and shaped for insertion into a cannulation of an intramedullary nail. The probe including a first longitudinal element extending along a longitudinal axis from a distal end to a proximal end and a second longitudinal element extending along a longitudinal axis from a distal end to a proximal end, the distal ends of the first and second longitudinal elements attached to one another so that the longitudinal axes of the first and second longitudinal elements extend substantially parallel to each other and define a middle plane. A measuring element measures relative axial displacement of the proximal ends of the first and second longitudinal elements in the middle plane upon bending of the first and second longitudinal elements as the probe is inserted into a cannulation of the intramedullary nail.