The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2014

Filed:

Feb. 06, 2012
Applicants:

Tamir Olpak, Petah Tigwa, IL;

Arie Gez, Netanyya, IL;

Inventors:

Tamir Olpak, Petah Tigwa, IL;

Arie Gez, Netanyya, IL;

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41F 13/10 (2006.01); B41F 1/34 (2006.01); B41C 1/00 (2006.01); B41C 1/05 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
B41C 1/00 (2013.01); B41C 1/05 (2013.01); G03F 7/2055 (2013.01);
Abstract

A mandrel position analyzer () in an imaging device () includes a head stock () for a first side of the mandrel; a tail stock () for a second side of the mandrel; a first encoder () attached to the head stock adapted to measure first signals wherein the first signals are generated by movement of the mandrel; a second encoder () attached to the tail stock adapted to measure second signals wherein the second signals are generated by movement of the mandrel; an analyzer () which compares measured results of the first signals and results of the second signals; and if the measured results do not match generating an abnormal state of the mandrel signal alarm ().


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