The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2014

Filed:

Dec. 23, 2010
Applicants:

Idan Alrod, Herzliya, IL;

Eran Sharon, Rishon Lezion, IL;

Toru Miwa, Kanagawa, JP;

Gerrit Jan Hemink, Kanagawa, JP;

Yee Lih Koh, Milpitas, CA (US);

Inventors:

Idan Alrod, Herzliya, IL;

Eran Sharon, Rishon Lezion, IL;

Toru Miwa, Kanagawa, JP;

Gerrit Jan Hemink, Kanagawa, JP;

Yee Lih Koh, Milpitas, CA (US);

Assignee:

Sandisk IL Ltd, Kfar Saba, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A non-volatile memory has its cells' thresholds programmed within any one of a first set of voltage bands partitioned by a first set of reference thresholds across a threshold window. The cells are read at a higher resolution relative to a second set of reference thresholds so as to provide additional soft bits for error correction. The reference thresholds of the second set are set up to be non-uniformly distributed on the threshold window so as to provide higher resolution at designated regions. At the same time they are conducive to be read in groups for soft bits to be read bit-by-bit systematically with a simple algorithm and read circuit and using a minimum of data latches. This is accomplished by relaxing the requirement that the first set of reference threshold is a subset of the second set and that the resulting soft bits are symmetrically distributed about the hard bits.


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