The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Dec. 28, 2011
Applicant:
Dae-suk Kim, Gyeonggi-do, KR;
Inventor:
Dae-Suk Kim, Gyeonggi-do, KR;
Assignee:
Hynix Semiconductor Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/56 (2006.01); G11C 29/48 (2006.01); G11C 29/44 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G11C 29/56 (2013.01); G11C 29/48 (2013.01); G11C 29/44 (2013.01); G11C 29/50 (2013.01);
Abstract
A test method for a memory having first and second cell arrays, first compressed data obtained by compressing output data of the first cell array and output data of the second cell array is outputted. When the first compressed data represents that a fail exists, output data of one of the first and second cell arrays is locked as normal data, and second compressed data obtained by compressing the normal data and output data of the other of the first and second cell arrays is outputted.
Kim, Dae-Suk. (2014). Memory and test method for memory (U.S. Patent No. 8782476). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8782476
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