The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Dec. 01, 2011
Albert Neumueller, Walldorf, DE;
Walter Zimmermann, Walldorf, DE;
Christian Hohmann, Walldorf, DE;
Olga Kreindlina, Heidelberg, DE;
Oliver Berger, Walldorf, DE;
Torsten Buecheler, Speyer, DE;
Martin Haerterich, Wiesloch, DE;
Knut Heusermann, Bad Schoenborn, DE;
Xenia Rieger, Walldorf, DE;
Guang Yang, Bad Schoenborn, DE;
Marcus Echter, Walldorf, DE;
Matthias Becker, Bruchsal, DE;
Dietmar Henkes, Schwetzingen, DE;
Sophie Kraut, Walldorf, DE;
Albert Neumueller, Walldorf, DE;
Walter Zimmermann, Walldorf, DE;
Christian Hohmann, Walldorf, DE;
Olga Kreindlina, Heidelberg, DE;
Oliver Berger, Walldorf, DE;
Torsten Buecheler, Speyer, DE;
Martin Haerterich, Wiesloch, DE;
Knut Heusermann, Bad Schoenborn, DE;
Xenia Rieger, Walldorf, DE;
Guang Yang, Bad Schoenborn, DE;
Marcus Echter, Walldorf, DE;
Matthias Becker, Bruchsal, DE;
Dietmar Henkes, Schwetzingen, DE;
Sophie Kraut, Walldorf, DE;
SAP AG, Walldorf, DE (US);
Abstract
Test data for a software services (e.g., a Web service) can be automatically generated from a user-provided specification. The user-provided specification may identify mandatory data elements along with data elements to be tested. Test categories may be defined to specify the type of test to be performed. A value provider may serve as a source of data values for the generated test data.