The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2014

Filed:

May. 18, 2012
Applicants:

Konstantinos Morfonios, Foster City, CA (US);

Leonidas Galanis, San Jose, CA (US);

Neoklis Polyzotis, Santa Cruz, CA (US);

Karl Dias, Foster City, CA (US);

Inventors:

Konstantinos Morfonios, Foster City, CA (US);

Leonidas Galanis, San Jose, CA (US);

Neoklis Polyzotis, Santa Cruz, CA (US);

Karl Dias, Foster City, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described herein are methods for determining patterns based on requests received by a server. Based on the determined patterns, insight into the types of requests received by the server can be gained. Additionally, performance statistics and query statistics can be aggregated in a useful way. For example, performance statistics may be summarized for each determined pattern. One technique for determining patterns includes determining a sequence of template identifiers identifying templates that correspond to sub-sequences of requests in a sequence of server requests. A model may be created based on the sequence of template identifiers. Based on the model, template patterns may be determined. Template patterns may further be grouped into pattern clusters.


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