The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2014

Filed:

Dec. 25, 2009
Applicants:

Mitsuru Kanokogi, Tokyo-to, JP;

Masahiro Ohishi, Tokyo-to, JP;

Inventors:

Mitsuru Kanokogi, Tokyo-to, JP;

Masahiro Ohishi, Tokyo-to, JP;

Assignee:

Kabushiki Kaisha TOPCON, Tokyo-to, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an electro-optical distance measurement, wherein a light from a light source () is projected toward an object to be measured (), a reflection light reflected by the object to be measured is received at a photodetection unit (), the light from the light source is received by the photodetection unit as an inner light via an inner optical path (), and a distance to the object to be measured is measured according to the result of photodetection of the reflection light and the inner light of the photodetection unit, and wherein a correction information is acquired based on the inner light, the acquired correction information is stored, a correction value is obtained from the correction information based on the reflection light and the inner light, and a distance is calculated from the correction value and the result of photodetection of the reflection light and the inner light.


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