The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Mar. 20, 2012
Yong Ho Kim, Bucheon-si, KR;
Ki Hyoung Cho, Anyang-si, KR;
Yong Ho Kim, Bucheon-si, KR;
Ki Hyoung Cho, Anyang-si, KR;
LG Electronics Inc., Seoul, KR;
Abstract
A method of scanning neighboring base stations for measuring channel quality in a wireless communication system includes receiving, by a mobile station from a serving base station, information associated with at least one neighboring base station; transmitting, by the mobile station to the serving base station, a scanning request message to request an allocation of a scanning interval for scanning, the scanning request message including parameters associated with a requested scan duration, a requested interleaving interval, and a requested scan iteration, wherein the requested interleaving interval is interleaved between each scan; and receiving, by the mobile station from the serving base station, a scanning response message including an allowed scan duration parameter in response to the scanning request message, wherein the allowed scan duration parameter is set to zero to indicate that the request for the allocation of the scanning interval is denied.