The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2014

Filed:

Sep. 01, 2010
Applicants:

Mingxing HU, London, GB;

Baptiste Allain, London, GB;

David Hawkes, London, GB;

Sebastien Ourselin, London, GB;

Laurence Lovat, London, GB;

Richard Cook, London, GB;

Inventors:

Mingxing Hu, London, GB;

Baptiste Allain, London, GB;

David Hawkes, London, GB;

Sebastien Ourselin, London, GB;

Laurence Lovat, London, GB;

Richard Cook, London, GB;

Assignee:

UCL Business PLC, London, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 1/00 (2006.01); A61B 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and a computer-implemented method are provided for determining a location in a target image (T) of a site on a surface of a physical object using two or more reference images (I, I) of said physical object that have been obtained with a reference imaging device. Each of said two or more reference images includes said site on the surface of the physical object and was obtained with the reference imaging device having a different position and/or orientation relative to said physical object. The target image is obtained by a target imaging device and includes the site on the surface of the physical object. For each reference image, a set of feature mappings from the reference image to the target image is used to determine the epipolar geometry between the reference image and the target image, and a projection of the site from the reference image onto the target image is calculated from said epipolar geometry. The location in the target image of the site on the surface of the physical object is determined from the calculated epipolar projections for the two or more reference images.


Find Patent Forward Citations

Loading…